Emissivity of liquid silicon in visible and infrared regions
作者:
Eiryo Takasuka,
Eiji Tokizaki,
Kazutaka Terashima,
Shigeyuki Kimura,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 9
页码: 6384-6389
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.364418
出版商: AIP
数据来源: AIP
摘要:
Normal spectral emissivity of Si melt in visible and infrared regions was determined by the direct measurement of thermal radiations from the melt and a blackbody cavity which was located close to the melt. The spectral emissivity slightly decreases with wavelength. The emissivity slightly changes with temperature. The spectral emissivity values in visible and in infrared region are 0.27 and 0.21, respectively. The wavelength dependence of the emissivity can be interpreted by a dielectric response of free electrons in the melt. ©1997 American Institute of Physics.
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