Growth of Er‐doped Si films by electron cyclotron resonance plasma enhanced chemical vapor deposition
作者:
Jim L. Rogers,
Walter J. Varhue,
Edward Adams,
Mark A. Lavoie,
Robert O. Frenette,
期刊:
Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films
(AIP Available online 1994)
卷期:
Volume 12,
issue 5
页码: 2762-2766
ISSN:0734-2101
年代: 1994
DOI:10.1116/1.579101
出版商: American Vacuum Society
关键词: SILICON;ERBIUM ADDITIONS;CVD;THIN FILMS;CRYSTAL DOPING;Si:Er
数据来源: AIP
摘要:
Epitaxial Si films doped with Er have been grown at low substrate temperatures by plasma enhanced chemical vapor deposition. The Er gas source is a sublimed organometallic compound fed into the process chamber. High doping concentrations without silicide precipitation are possible because of the low deposition temperatures. The process relies on the beneficial effects of low energy ion bombardment to reduce the growth temperature. The ions as well as reactive chemical species are produced by an electron cyclotron resonance plasma stream source. A hydrogen/argon plasma is used to perform aninsitupredeposition clean to remove oxide from the Si surface. Film quality and impurity concentration are determined by Rutherford backscattering spectrometry and secondary ion mass spectrometry.
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