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Ultrahigh‐vacuum system for surface studies using high‐energy ion scattering and x‐ray photoemission spectroscopy

 

作者: R. J. Smith,   C. N. Whang,   Xu Mingde,   M. Worthington,   C. Hennessy,   M. Kim,   N. Holland,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1987）
卷期: Volume 58, issue 12  

页码: 2284-2287

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139337

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We describe a new ultrahigh‐vacuum facility which is being used for studies of solid surfaces. The target chamber is attached via a differentially pumped beamline to a 2‐MV Van de Graaff accelerator, and includes: (1) instrumentation for high‐energy ion backscattering and channeling studies and nuclear reaction analysis, (2) a 100‐mm radius hemispherical analyzer for photoemission studies, and (3) low‐energy electron diffraction (LEED) optics.

 

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