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Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

 

作者: M. Martinelli,   S. Bian,   J. R. Leite,   R. J. Horowicz,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 12  

页码: 1427-1429

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.120584

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We demonstrate a new experimental method which allows the measurement of the nonlinear optic index in absorptive media with great sensitivity. In this technique the reflection from a polarized Gaussian laser beam close to the Brewster angle is measured. A sensitivity enhancement factor of 30 with respect to other techniques is observed for an optical crystal, and higher values are possible to be obtained. ©1998 American Institute of Physics.

 

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