Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
作者:
M. Martinelli,
S. Bian,
J. R. Leite,
R. J. Horowicz,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 12
页码: 1427-1429
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.120584
出版商: AIP
数据来源: AIP
摘要:
We demonstrate a new experimental method which allows the measurement of the nonlinear optic index in absorptive media with great sensitivity. In this technique the reflection from a polarized Gaussian laser beam close to the Brewster angle is measured. A sensitivity enhancement factor of 30 with respect to other techniques is observed for an optical crystal, and higher values are possible to be obtained. ©1998 American Institute of Physics.
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