Normal‐incidence strained‐layer superlattice Ge0.5Si0.5/Si photodiodes near 1.3 &mgr;m
作者:
F. Y. Huang,
X. Zhu,
M. O. Tanner,
K. L. Wang,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 4
页码: 566-568
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.115171
出版商: AIP
数据来源: AIP
摘要:
Ge0.5Si0.5strained‐layerpinphotodiodes, in which multiple strained layers serve as the absorption region, have been fabricated. These devices exhibit an optical response at wavelengths beyond 1.3 &mgr;m at normal incidence. The measured external quantum efficiencies at an applied bias of 4 V are 17% at 0.85 &mgr;m and 1% at 1.3 &mgr;m, respectively. Excellent electrical characteristics evidenced by the avalanche breakdown at 20 V have also been demonstrated. ©1995 American Institute of Physics.
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