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Normal‐incidence strained‐layer superlattice Ge0.5Si0.5/Si photodiodes near 1.3 &mgr;m

 

作者: F. Y. Huang,   X. Zhu,   M. O. Tanner,   K. L. Wang,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 4  

页码: 566-568

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115171

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ge0.5Si0.5strained‐layerpinphotodiodes, in which multiple strained layers serve as the absorption region, have been fabricated. These devices exhibit an optical response at wavelengths beyond 1.3 &mgr;m at normal incidence. The measured external quantum efficiencies at an applied bias of 4 V are 17% at 0.85 &mgr;m and 1% at 1.3 &mgr;m, respectively. Excellent electrical characteristics evidenced by the avalanche breakdown at 20 V have also been demonstrated. ©1995 American Institute of Physics.

 

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