Power‐temperature cycle accelerated testing
作者:
Louis J. Hart,
Kipp L. Bruning,
期刊:
Quality and Reliability Engineering International
(WILEY Available online 1995)
卷期:
Volume 11,
issue 1
页码: 41-48
ISSN:0748-8017
年代: 1995
DOI:10.1002/qre.4680110107
出版商: Wiley Subscription Services, Inc., A Wiley Company
关键词: accelerated testing;activation energy;Arrhenius model;Coffin–Manson model;mathematical model;power cycling;reliability;step‐stress;thermal cycling
数据来源: WILEY
摘要:
AbstractTwo separate reliability models are proposed which one may wish to use to assess product performance. By combining stresses associated with traditional high temperature tests, temperature cycling tests and power cycling tests, we believe more representative and comprehensive reliability tests can be created. Although this understandably makes the models employed slightly more complex, the introduction of a step‐stress methodology compensates for this, thereby eliminating the requirement for additional test cells to determine the particular model's parameters. Estimates for the model parameters, or their associated acceleration factors relative to the normal use environment, will enable us to make accurate reliability prediction
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