Intrinsic Josephson effect devices of TI-2212 thin films
作者:
S. I. Yan,
L. Fang,
M. S. Si,
J. Wang,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 1
页码: 480-481
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365842
出版商: AIP
数据来源: AIP
摘要:
Intrinsic Josephson effect devices fromTl2Ba2CaCu2O8(Tl-2212) thin films were investigated. The device was produced by epitaxially growing a Tl-2212 thin film on aLaAlO3substrate with the surface cut at a small angle to theLaAlO3(001) plane, and by patterning a microbridge in the proper direction. TheI–Vcharacteristics of the microbridges exhibit large hysteresis at low temperatures, and the temperature dependence of the critical currentIc(T)is in good agreement with the theoretical Ambegaokar–Baratoff relation for superconductor–insulator–superconductor (SIS) junctions. TheI–Vcurves also show multibranches for longer microbridges. ©1997 American Institute of Physics.
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