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Multi-mode noise analysis of cantilevers for scanning probe microscopy

 

作者: M. V. Salapaka,   H. S. Bergh,   J. Lai,   A. Majumdar,   E. McFarland,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 81, issue 6  

页码: 2480-2487

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.363955

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A multi-mode analysis of micro-cantilever dynamics is presented. We derive the power spectral density of the cantilever displacement due to a thermal noise source and predict the cantilevers’s fundamental resonant frequency and higher harmonics. The first mode in the multi-mode model is equivalent to the traditional single-mode model. Experimental results obtained with a silicon nitride cantilever at 300 K are in excellent qualitative agreement with the multi-mode model. The multi-mode model may be used to obtain accurate values of the cantilever properties such as the elastic modulus, effective mass, thickness and moment of inertia. ©1997 American Institute of Physics.

 

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