InsituKerr microscopy for ultrahigh vacuum applications
作者:
J. Giergiel,
J. Kirschner,
期刊:
Review of Scientific Instruments
(AIP Available online 1996)
卷期:
Volume 67,
issue 8
页码: 2937-2939
ISSN:0034-6748
年代: 1996
DOI:10.1063/1.1147075
出版商: AIP
数据来源: AIP
摘要:
A simple Kerr microscope designed forinsituinvestigation of magnetic ultrathin films in ultrahigh vacuum environment is described. The system permits quick visualization of domain patterns with 10 &mgr;m lateral resolution. Simultaneous optical magnetometry is also possible. The performance of the system is illustrated with domain images in a few layers thick Fe films on Cu(001) and W(110). ©1996 American Institute of Physics.
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