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Transmission electron microscopy investigation of structural properties of self-assembled CdSe/ZnSe quantum dots

 

作者: H. Kirmse,   R. Schneider,   M. Rabe,   W. Neumann,   F. Henneberger,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 11  

页码: 1329-1331

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.120984

 

出版商: AIP

 

数据来源: AIP

 

摘要:

CdSe quantum dots on ZnSe, grown by molecular beam epitaxy and formed during reorganization of an initially uniform film by thermal activation, are microstructurally elucidated in cross section and plan view, using transmission electron microscopy. In diffraction contrast, an almost uniform wetting layer is clearly visible. Dark contrast features with a distinctly larger extension into growth direction mark the location of quantum dots. Individual quantum dots can be identified in high-resolution imaging both by lattice expansion and contrasts arising from their strain fields. Plan-view images show the coexistence of two classes of quantum dots with an average lateral size of⩽10 nm(area density100 &mgr;m−2) and 10–50 nm(20 &mgr;m−2),respectively. The shape of the larger entities is pyramidlike. ©1998 American Institute of Physics.

 

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