首页   按字顺浏览 期刊浏览 卷期浏览 Deep level photoluminescence spectroscopy of CdTe epitaxial layer surfaces
Deep level photoluminescence spectroscopy of CdTe epitaxial layer surfaces

 

作者: J. L. Shaw,   L. J. Brillson,   S. Sivananthan,   J. P. Faurie,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 56, issue 13  

页码: 1266-1268

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.102532

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have used deep level photoluminescence spectroscopy to investigate the surface electronic quality of molecular beam epitaxy (MBE) grown CdTe layers during ultrahigh vacuum cleaning. Spectra are highly sensitive to heat treatment, contamination, and electron beam exposure. The technique provides a guide to growth and cleaning of MBE films of optimal electronic quality, which exhibit intense near‐band‐edge and minimal deep level emission and which exceed substantially the electronic quality of bulk CdTe crystals.

 

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