Deep level photoluminescence spectroscopy of CdTe epitaxial layer surfaces
作者:
J. L. Shaw,
L. J. Brillson,
S. Sivananthan,
J. P. Faurie,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 13
页码: 1266-1268
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.102532
出版商: AIP
数据来源: AIP
摘要:
We have used deep level photoluminescence spectroscopy to investigate the surface electronic quality of molecular beam epitaxy (MBE) grown CdTe layers during ultrahigh vacuum cleaning. Spectra are highly sensitive to heat treatment, contamination, and electron beam exposure. The technique provides a guide to growth and cleaning of MBE films of optimal electronic quality, which exhibit intense near‐band‐edge and minimal deep level emission and which exceed substantially the electronic quality of bulk CdTe crystals.
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