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Electrostatic Electron Microscopy. I

 

作者: C. H. Bachman,   Simon Ramo,  

 

期刊: Journal of Applied Physics  (AIP Available online 1943)
卷期: Volume 14, issue 1  

页码: 8-18

 

ISSN:0021-8979

 

年代: 1943

 

DOI:10.1063/1.1714924

 

出版商: AIP

 

数据来源: AIP

 

摘要:

This paper, consisting of three parts, describes investigations made with the objective of developing a simplified, practical microscope of the type which yields magnified images of transparent specimens with a resolving power superior to that of the best light microscopes. The first part deals with the general problem of design, including the electron gun and the imaging lenses. A later part will describe a completed instrument embodying many of the results of the investigations.

 

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