Electrostatic Electron Microscopy. I
作者:
C. H. Bachman,
Simon Ramo,
期刊:
Journal of Applied Physics
(AIP Available online 1943)
卷期:
Volume 14,
issue 1
页码: 8-18
ISSN:0021-8979
年代: 1943
DOI:10.1063/1.1714924
出版商: AIP
数据来源: AIP
摘要:
This paper, consisting of three parts, describes investigations made with the objective of developing a simplified, practical microscope of the type which yields magnified images of transparent specimens with a resolving power superior to that of the best light microscopes. The first part deals with the general problem of design, including the electron gun and the imaging lenses. A later part will describe a completed instrument embodying many of the results of the investigations.
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