Low energy boron implantation in isotopically pure silicon by simulation
作者:
Demetre E. Tsatis,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1992)
卷期:
Volume 10,
issue 2
页码: 648-650
ISSN:1071-1023
年代: 1992
DOI:10.1116/1.586426
出版商: American Vacuum Society
关键词: SILICON;ION IMPLANTATION;BORON IONS;KEV RANGE 01−10;KEV RANGE 10−100;MONTE CARLO METHOD;RANGE;ISOTOPE EFFECTS;T CODES;Si:B
数据来源: AIP
摘要:
The range profile for the combination implantation of10B and11B into the three stable isotopes of silicon28Si,29Si, and30Si in the energy range between 1 and 50 keV, has been studied by using the Monte Carlo simulation programtrim. It is found that for a given boron isotope, the implantation profile depends strongly on the isotopic state of silicon. The presence of the least abundant isotopes29Si and30Si, in silicon of natural abundance, influence considerably the range profile.
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