首页   按字顺浏览 期刊浏览 卷期浏览 Low energy boron implantation in isotopically pure silicon by simulation
Low energy boron implantation in isotopically pure silicon by simulation

 

作者: Demetre E. Tsatis,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1992)
卷期: Volume 10, issue 2  

页码: 648-650

 

ISSN:1071-1023

 

年代: 1992

 

DOI:10.1116/1.586426

 

出版商: American Vacuum Society

 

关键词: SILICON;ION IMPLANTATION;BORON IONS;KEV RANGE 01−10;KEV RANGE 10−100;MONTE CARLO METHOD;RANGE;ISOTOPE EFFECTS;T CODES;Si:B

 

数据来源: AIP

 

摘要:

The range profile for the combination implantation of10B and11B into the three stable isotopes of silicon28Si,29Si, and30Si in the energy range between 1 and 50 keV, has been studied by using the Monte Carlo simulation programtrim. It is found that for a given boron isotope, the implantation profile depends strongly on the isotopic state of silicon. The presence of the least abundant isotopes29Si and30Si, in silicon of natural abundance, influence considerably the range profile.

 

点击下载:  PDF (196KB)



返 回