A tunable microwave frequency alternating current scanning tunneling microscope
作者:
S. J. Stranick,
P. S. Weiss,
期刊:
Review of Scientific Instruments
(AIP Available online 1994)
卷期:
Volume 65,
issue 4
页码: 918-921
ISSN:0034-6748
年代: 1994
DOI:10.1063/1.1144921
出版商: AIP
数据来源: AIP
摘要:
By modulating the scanning tunneling microscope junction bias voltage at microwave frequencies, imaging and spectroscopy of insulating surfaces have become possible. In order to explore the spectroscopic capabilities of this instrument, we have developed a tunable microwave frequency alternating current scanning tunneling microscope. We combine the reliable beetle‐style sample approach with coaxial sample and tip contacts. This provides us with a stable microwave‐frequency‐compatible scanning tunneling microscope. This alternating current scanning tunneling microscope design is compatible with ultrahigh vacuum and low‐temperature operation.
点击下载:
PDF
(467KB)
返 回