首页   按字顺浏览 期刊浏览 卷期浏览 Carrier–carrier scattering effects in InGaAs–GaAs strained layer lasers
Carrier–carrier scattering effects in InGaAs–GaAs strained layer lasers

 

作者: P.Rees,   R.A.H.Hamilton,   P.Blood,   S.V.Burke,  

 

期刊: IEE Proceedings J (Optoelectronics)  (IET Available online 1993)
卷期: Volume 140, issue 1  

页码: 81-84

 

年代: 1993

 

DOI:10.1049/ip-j.1993.0015

 

出版商: IEE

 

数据来源: IET

 

摘要:

The authors have calculated the gain-current characteristics of a 70 A In0.2Ga0.8As—GaAs strained layer quantum well laser assuming strictk-selection and including spectral broadening due to carrier–carrier interactions at high carrier densities. The broadening lifetime, which is dependent upon energy and carrier density, has been calculated from first principles using an intraband Auger-type process. The effect of both electron–electron and hole-hole scattering has been included in the calculation of this lifetime. The paper compares the effect on the gain-current characteristics of the energy dependent lifetime and of a constant lifetime of 10−13s used typically in other calculations.

 

点击下载:  PDF (400KB)



返 回