Electronic structures at the interfaces between copper phthalocyanine and layered materials
作者:
T. Shimada,
K. Hamaguchi,
A. Koma,
F. S. Ohuchi,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 15
页码: 1869-1871
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.121210
出版商: AIP
数据来源: AIP
摘要:
Copper phtalocyanine (CuPc) films with the thickness controlled in molecular scales have been grown epitaxially on (0001) surfaces of layered materials, and electronic interaction at the interfaces have been studied by photoelectron spectroscopy. Materials with different electronic properties having different work functions(Evac)were chosen as the substrates; semiconductingMoTe2(Evac=4.0 eV),semi-metallic highly oriented pyrolytic graphite(Evac=4.5 eV)and metallicTaSe2(Evac=5.5 eV).Formation of interface dipole layers was found atCuPc/TaSe2interfaces and molecular orbitals involved were identified. ©1998 American Institute of Physics.
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