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Aluminum on Si(100): Growth and structure of the first layer

 

作者: G. Brocks,   P. J. Kelly,   R. Car,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1994)
卷期: Volume 12, issue 4  

页码: 2705-2708

 

ISSN:1071-1023

 

年代: 1994

 

DOI:10.1116/1.587235

 

出版商: American Vacuum Society

 

关键词: SILICON;ALUMINIUM;FILM GROWTH;ELECTRONIC STRUCTURE;ADSORPTION;SURFACE STATES;ENERGY GAP;AB INITIO CALCULATIONS;PSEUDOPOTENTIAL;Si;Al

 

数据来源: AIP

 

摘要:

The growth and the (electronic) structure of a single layer of aluminum on the Si(100) surface are examined by means of first principles calculations. The calculated local density of states is used to interprete scanning tunneling microscopy data. We identify the adsorption sites that give rise to the polymerization‐like one‐dimensional growth of Al. The Al‐induced surface states of thep(2×2) covered Si(100) surface are calculated. The surface bandgap is increased, as compared to the clean Si(100) surface, which means that the first adsorbed Al layer passivates the surface electrically.

 

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