Aluminum on Si(100): Growth and structure of the first layer
作者:
G. Brocks,
P. J. Kelly,
R. Car,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1994)
卷期:
Volume 12,
issue 4
页码: 2705-2708
ISSN:1071-1023
年代: 1994
DOI:10.1116/1.587235
出版商: American Vacuum Society
关键词: SILICON;ALUMINIUM;FILM GROWTH;ELECTRONIC STRUCTURE;ADSORPTION;SURFACE STATES;ENERGY GAP;AB INITIO CALCULATIONS;PSEUDOPOTENTIAL;Si;Al
数据来源: AIP
摘要:
The growth and the (electronic) structure of a single layer of aluminum on the Si(100) surface are examined by means of first principles calculations. The calculated local density of states is used to interprete scanning tunneling microscopy data. We identify the adsorption sites that give rise to the polymerization‐like one‐dimensional growth of Al. The Al‐induced surface states of thep(2×2) covered Si(100) surface are calculated. The surface bandgap is increased, as compared to the clean Si(100) surface, which means that the first adsorbed Al layer passivates the surface electrically.
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