AmorphousSiC/SiO2distributed Bragg reflectors (DBR) deposited by ion beam sputtering at room temperature is reported on in this letter. The DBR consists of only 2.5 pairs and exhibits high peak reflectivity (84&percent;) around ∼1.7 &mgr;m with a full width at half maximum of about 1000 nm. The measured reflectivity spectrum is well reproduced by the equivalent layer theory by using the measured refractive indices of SiC andSiO2and including absorption losses. ©1997 American Institute of Physics.