Kelvin probe force microscopy
作者:
M. Nonnenmacher,
M. P. O’Boyle,
H. K. Wickramasinghe,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 58,
issue 25
页码: 2921-2923
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.105227
出版商: AIP
数据来源: AIP
摘要:
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.
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