Electrostatic tip-surface interaction in scanning force microscopy: A convenient expression useful for arbitrary tip and sample geometries
作者:
Fredy R. Zypman,
Steven J. Eppell,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1997)
卷期:
Volume 15,
issue 6
页码: 1853-1860
ISSN:1071-1023
年代: 1997
DOI:10.1116/1.589567
出版商: American Vacuum Society
数据来源: AIP
摘要:
The electrostatic energy between a dielectric scanning force microscope (SFM) tip and a point charge is obtained in closed form as a function of the separation of the two objects. Applications of this result to both spherical and arbitrary tip shapes are discussed. Also, utilizing kinematic data, a method is given to experimentally extract the force due to the tip-sample interaction from a typical SFM instrument. This is done by analyzing the time dependent motion of the tip. The result is based on the use of a time dependent analysis of the force distance curve which is unavoidable in motion regimes in which the tip accelerates, as in the snap-to-contact process.
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