Synthetic wide bandpass x-ray polarizers
作者:
J. O. Cross,
B. R. Bennett,
M. I. Bell,
K. J. Kuhn,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 17
页码: 2224-2226
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118822
出版商: AIP
数据来源: AIP
摘要:
A wide bandpass x-ray polarizer for photon energies near 8358 eV(LIIIabsorption edge of erbium) has been grown using molecular beam epitaxy. The results illustrate a general approach to preparing graded-lattice diffracting optical components. The active optical element is an 8-&mgr;m-thick single crystal film ofIn0.51Ga0.49Sbgrown on a GaAs (001) substrate. The alloy was chosen to ensure maximum linear polarization for the (006) Bragg reflection at the target energy. The polarizer reflectivity has a full width at half-maximum of 27 eV in a fixed geometry with an angle of 90° between the incident and diffracted beams. ©1997 American Institute of Physics.
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