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Synthetic wide bandpass x-ray polarizers

 

作者: J. O. Cross,   B. R. Bennett,   M. I. Bell,   K. J. Kuhn,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 17  

页码: 2224-2226

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.118822

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A wide bandpass x-ray polarizer for photon energies near 8358 eV(LIIIabsorption edge of erbium) has been grown using molecular beam epitaxy. The results illustrate a general approach to preparing graded-lattice diffracting optical components. The active optical element is an 8-&mgr;m-thick single crystal film ofIn0.51Ga0.49Sbgrown on a GaAs (001) substrate. The alloy was chosen to ensure maximum linear polarization for the (006) Bragg reflection at the target energy. The polarizer reflectivity has a full width at half-maximum of 27 eV in a fixed geometry with an angle of 90° between the incident and diffracted beams. ©1997 American Institute of Physics.

 

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