首页   按字顺浏览 期刊浏览 卷期浏览 Fast decay component of the remanent polarization in thin-film PZT capacitors
Fast decay component of the remanent polarization in thin-film PZT capacitors

 

作者: JosephM. Benedetto,   RandallA Moore,   FBarry McLean,  

 

期刊: Integrated Ferroelectrics  (Taylor Available online 1992)
卷期: Volume 1, issue 2-4  

页码: 195-204

 

ISSN:1058-4587

 

年代: 1992

 

DOI:10.1080/10584589208215711

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The remanent polarization (2Pr) of thin-film PZT capacitors was examined using a voltage pulse method. The amount of polarization remaining after a “write” pulse was found to be a function of both the time between the write and read pulses and the duration of the write pulse. The 2Prwas found to decrease significantly from 3 μs to 100 ms after the initial write. In some cases the remanent polarization decayed by almost 70 percent in this time regime. The fast decay component of 2Prwas also observed to be dependent on the duration of the write pulse (the write, pulse width). The longer the write pulse was applied the smaller the fast decay component became, leaving more measurable charge retained after 100 ms.

 

点击下载:  PDF (430KB)



返 回