Fast decay component of the remanent polarization in thin-film PZT capacitors
作者:
JosephM. Benedetto,
RandallA Moore,
FBarry McLean,
期刊:
Integrated Ferroelectrics
(Taylor Available online 1992)
卷期:
Volume 1,
issue 2-4
页码: 195-204
ISSN:1058-4587
年代: 1992
DOI:10.1080/10584589208215711
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The remanent polarization (2Pr) of thin-film PZT capacitors was examined using a voltage pulse method. The amount of polarization remaining after a “write” pulse was found to be a function of both the time between the write and read pulses and the duration of the write pulse. The 2Prwas found to decrease significantly from 3 μs to 100 ms after the initial write. In some cases the remanent polarization decayed by almost 70 percent in this time regime. The fast decay component of 2Prwas also observed to be dependent on the duration of the write pulse (the write, pulse width). The longer the write pulse was applied the smaller the fast decay component became, leaving more measurable charge retained after 100 ms.
点击下载:
PDF (430KB)
返 回