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Scanning local‐acceleration microscopy

 

作者: N. A. Burnham,   A. J. Kulik,   G. Gremaud,   P.‐J. Gallo,   F. Oulevey,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  （AIP Available online 1996）
卷期: Volume 14, issue 2  

页码: 794-799

 

ISSN:1071-1023

 

年代: 1996

 

DOI:10.1116/1.588715

 

出版商: American Vacuum Society

 

关键词: COMPOSITE MATERIALS;MICROSCOPY;ACCELERATION;SENSITIVITY;FREQUENCY DEPENDENCE

 

数据来源: AIP

 

摘要:

By adapting a scanning force microscope to operate at frequencies above the highest tip–sample resonance, the sensitivity of the microscope to materials’ properties is greatly enhanced. The cantilever’s behavior in response to high‐frequency excitation from a transducer underneath the sample is fundamentally different than to its low‐frequency response. In this article, the motivations, instrumentation, theory, and first results for this technique are described.

 

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