首页   按字顺浏览 期刊浏览 卷期浏览 Tests for multiple upper or lower outliers in an exponential sample
Tests for multiple upper or lower outliers in an exponential sample

 

作者: Jin Zhang,  

 

期刊: Journal of Applied Statistics  (Taylor Available online 1998)
卷期: Volume 25, issue 2  

页码: 245-255

 

ISSN:0266-4763

 

年代: 1998

 

DOI:10.1080/02664769823232

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

T = \[x + … + x ]/ Sigma x (T*= \[x + … + x ] Sigma x ) is the max k (n- k+ 1 ) (n) i k ( 1 ) (k) i imum likelihood ratio test statistic for k upper ( lower ) outliers in an exponential sample x , …, x . The null distributions of T for k= 1,2 were given by Fisher and by Kimber 1 n k and Stevens , while those of T*(k= 1,2) were given by Lewis and Fieller . In this paper , k the simple null distributions of T and T* are found for all possible values of k, and k k percentage points are tabulated for k= 1, 2, …, 8. In addition , we find a way of determining k, which can reduce the masking or ' swamping ' effects .

 

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