The growth of high‐quality, sputter‐deposited epitaxial PtMnSb(001) on W(001)/MgO(001) is described. X‐ray diffraction results indicate that PtMnSb grows unrotated on the W seed layer with a modest in‐plane tensile strain. Polar magneto‐optic Kerr effect measurements show a peak rotation of 1.02° at 575 nm. In‐plane magnetization is observed, indicating that the level of strain in the film is insufficient to induce perpendicular magnetization. ©1995 American Institute of Physics.