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X‐ray photoelectron spectroscopy studies ofn‐type bismuth‐modified amorphous thin films of Ge20Se80and As2Se3

 

作者: Sunil Kumar,   Subhash C. Kashyap,   K. L. Chopra,  

 

期刊: Journal of Applied Physics  (AIP Available online 1992)
卷期: Volume 72, issue 5  

页码: 2066-2068

 

ISSN:0021-8979

 

年代: 1992

 

DOI:10.1063/1.351638

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The charged state of bismuth atoms inn‐type bismuth‐modified amorphous thin films of Ge20Se80and As2Se3has been studied by x‐ray photoelectron spectroscopy. On the basis of the observed chemical shift, it is concluded that the Bi atoms in the modified films are positively charged. The charged Bi atoms perturb the equilibrium between positively and negatively charged defect centers, thereby causing a shift of the Fermi level towards the conduction band. The observed enhanced electrical conductivity and the conductivity conversion fromptontype in the modified films is the result of such a Fermi level shift.

 

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