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A Truncated Sequential t-Test for General α and β

 

作者: Robert Alexander,   Ronald Suich,  

 

期刊: Technometrics  (Taylor Available online 1973)
卷期: Volume 15, issue 1  

页码: 79-86

 

ISSN:0040-1706

 

年代: 1973

 

DOI:10.1080/00401706.1973.10489012

 

出版商: Taylor & Francis Group

 

关键词: Truncated;Sequential t-Test;Simulated Comparisons

 

数据来源: Taylor

 

摘要:

This paper extends the truncated sequentialt-test presented by Suich and Iglewicz (1970) for α = β to the more general (α ≠ β This test is then compared with Barnard's non-truncated sequentialt-test and with the fixed sample-size procedure. This comparison includes OC and ASN curves and the standard deviation ofn. The test is then extended to a two-sided procedure and compared with the truncated sequentialt-test of Schneiderman and Armitage (1962).

 

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