A Truncated Sequential t-Test for General α and β
作者:
Robert Alexander,
Ronald Suich,
期刊:
Technometrics
(Taylor Available online 1973)
卷期:
Volume 15,
issue 1
页码: 79-86
ISSN:0040-1706
年代: 1973
DOI:10.1080/00401706.1973.10489012
出版商: Taylor & Francis Group
关键词: Truncated;Sequential t-Test;Simulated Comparisons
数据来源: Taylor
摘要:
This paper extends the truncated sequentialt-test presented by Suich and Iglewicz (1970) for α = β to the more general (α ≠ β This test is then compared with Barnard's non-truncated sequentialt-test and with the fixed sample-size procedure. This comparison includes OC and ASN curves and the standard deviation ofn. The test is then extended to a two-sided procedure and compared with the truncated sequentialt-test of Schneiderman and Armitage (1962).
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