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Determination of composition and thickness of TiNxOyfilms on silicon by combined x‐ray and nuclear microanalysis

 

作者: A. Armigliato,   A. Garulli,   R. Rosa,   M. Berti,   A. V. Drigo,   A. Desalvo,  

 

期刊: X‐Ray Spectrometry  (WILEY Available online 1983)
卷期: Volume 12, issue 1  

页码: 38-41

 

ISSN:0049-8246

 

年代: 1983

 

DOI:10.1002/xrs.1300120109

 

出版商: Wiley Subscription Services, Inc., A Wiley Company

 

数据来源: WILEY

 

摘要:

AbstractThe stoichiometry and thickness of TiNxOyfilms has been determined by electron microprobe and nuclear microanalysis. The difficulty arising in the electron microprobe from the interference between NKα and TiLI lines has been overcome by using a suitable Monte Carlo computing scheme. This procedure takes into account the SiKα intensity which was found to be sensitive to composition and thickness of the overlying TiNxOyfilm. The good agreement between electron microprobe and nuclear microanalysis results indicate the validity of the metho

 

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