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Analytical descriptions of the tapping-mode atomic force microscopy response

 

作者: Lugen Wang,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 73, issue 25  

页码: 3781-3783

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.122893

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The tapping-mode atomic force microscopy response has been analyzed by the Krylov–Bogolubov–Mitropolsky asymptotic method. Due to the presence of repulsive force, attractive force and damping in the tip-sample interaction, the response exhibits complicate nonlinear phenomena. The numerical and experimental results shows that the phenomena can be well described by this approximation solution when the driving frequency is close to the free resonance frequency and the setpoint amplitude ratio is larger than 0.4. ©1998 American Institute of Physics.

 

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