Growth and characterization of InSbBi for long wavelength infrared photodetectors
作者:
J. J. Lee,
J. D. Kim,
M. Razeghi,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 24
页码: 3266-3268
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119158
出版商: AIP
数据来源: AIP
摘要:
The epitaxial growth of InSbBi ternary alloys by low-pressure metalorganic chemical vapor deposition is reported on. X-ray diffraction spectra showed well resolved peaks of InSbBi and InSb films. Bi incorporation was confirmed by energy dispersive x-ray analysis. Photoresponse spectrum up to 9.3&mgr;m which corresponds to 0.13 eV energy band gap has been measured in a sample with Bi composition of 5.8 at.&percent; at 77 K. Electron mobility at room temperature ranges from 44 100 to 4910 cm2/Vs as Bi composition increases. ©1997 American Institute of Physics.
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