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Growth and characterization of InSbBi for long wavelength infrared photodetectors

 

作者: J. J. Lee,   J. D. Kim,   M. Razeghi,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 24  

页码: 3266-3268

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119158

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The epitaxial growth of InSbBi ternary alloys by low-pressure metalorganic chemical vapor deposition is reported on. X-ray diffraction spectra showed well resolved peaks of InSbBi and InSb films. Bi incorporation was confirmed by energy dispersive x-ray analysis. Photoresponse spectrum up to 9.3&mgr;m which corresponds to 0.13 eV energy band gap has been measured in a sample with Bi composition of 5.8 at.&percent; at 77 K. Electron mobility at room temperature ranges from 44 100 to 4910 cm2/Vs as Bi composition increases. ©1997 American Institute of Physics.

 

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