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Defects Observed in Electron Irradiated Pure Silver by Electron Microscopy

 

作者: Y. Shimomura,  

 

期刊: Journal of Applied Physics  (AIP Available online 1970)
卷期: Volume 41, issue 2  

页码: 749-759

 

ISSN:0021-8979

 

年代: 1970

 

DOI:10.1063/1.1658743

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Nominally 99.9999% pure silver strips were irradiated near 140°K with 3 MeV electrons. Fluences ranged from 0.05 to 6.7×1018electrons/cm2. In order to observe defects which exist in irradiated specimens by electron microscopy at temperatures below stage III annealing, specimens were thinned, washed, and mounted on a specimen holder below −60°C. They were also dried below −60°C and observed using a liquid‐nitrogen cooling stage. A large number of interstitial loops were observed below stage III. The number of loops was constant but the size of the loops increased with increasing fluence. They shrank and disappeared during stage III annealing. After annealing at 0°C, another kind of small dot defects were observed. The results suggest that the stage III annealing occurs by a vacancy or divacancy migration in electron irradiated pure silver.

 

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