首页   按字顺浏览 期刊浏览 卷期浏览 Recrystallization of Thin Films of &agr; Cu&sngbnd;Ge Alloys
Recrystallization of Thin Films of &agr; Cu&sngbnd;Ge Alloys

 

作者: M. Ahlers,   L. F. Vassamillet,  

 

期刊: Journal of Applied Physics  （AIP Available online 1969）
卷期: Volume 40, issue 5  

页码: 2335-2339

 

ISSN:0021-8979

 

年代: 1969

 

DOI:10.1063/1.1657984

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ultramicrotomed foils of Cu and Cu‐5 at.% Ge were annealed in the electron microscope. Nucleation and growth of recrystallized grains were observed and their orientations determined. It was found that the fastest growing grains had an orientation relationship with the deformed lattice, which could be described in terms of high‐order {114} twins.

 

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