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Excitation efficiency in thin‐film electroluminescent devices: Probe layer measurements

 

作者: J. Benoit,   C. Barthou,   P. Benalloul,  

 

期刊: Journal of Applied Physics  (AIP Available online 1993)
卷期: Volume 73, issue 3  

页码: 1435-1442

 

ISSN:0021-8979

 

年代: 1993

 

DOI:10.1063/1.353242

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The study of the excitation efficiency &eegr;excon thin‐film electroluminescent devices with special semiconductor layer—a very thin probe‐doped layer located at different part of the pure ZnS layer—has proved that &eegr;excis not homogeneous across the active layer. Moreover, this variation of &eegr;excdepends on the amount of the transferred charge. At high excitation range, &eegr;excdecreases continuously from the cathode toward the anode of the active layer. This behavior of &eegr;excis related to a space charge located in some part of the ZnS layer and generated by the energetic electrons. This space charge reduces the total efficiency of a conventional device when operating at high excitation range.

 

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