Excitation efficiency in thin‐film electroluminescent devices: Probe layer measurements
作者:
J. Benoit,
C. Barthou,
P. Benalloul,
期刊:
Journal of Applied Physics
(AIP Available online 1993)
卷期:
Volume 73,
issue 3
页码: 1435-1442
ISSN:0021-8979
年代: 1993
DOI:10.1063/1.353242
出版商: AIP
数据来源: AIP
摘要:
The study of the excitation efficiency &eegr;excon thin‐film electroluminescent devices with special semiconductor layer—a very thin probe‐doped layer located at different part of the pure ZnS layer—has proved that &eegr;excis not homogeneous across the active layer. Moreover, this variation of &eegr;excdepends on the amount of the transferred charge. At high excitation range, &eegr;excdecreases continuously from the cathode toward the anode of the active layer. This behavior of &eegr;excis related to a space charge located in some part of the ZnS layer and generated by the energetic electrons. This space charge reduces the total efficiency of a conventional device when operating at high excitation range.
点击下载:
PDF
(1000KB)
返 回