Control of diamond heteroepitaxy on nickel by optical reflectance
作者:
P. C. Yang,
R. Schlesser,
C. A. Wolden,
W. Liu,
R. F. Davis,
Z. Sitar,
J. T. Prater,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 22
页码: 2960-2962
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118756
出版商: AIP
数据来源: AIP
摘要:
Real timein situlaser reflectometry was used to investigate changes in surface morphology observed during the nucleation of oriented diamond on Ni in a hot filament chemical vapor deposition reactor. Characteristic features observed in the intensities of reflected and scattered light were interpreted by comparison with scanning electron micrographs of the diamond seeded substrates quenched at sequential stages of the process. Based on this analysis, a process was developed in which the scattered light signal was used as a steering parameter. Using this process, oriented nucleation and growth of diamond on Ni can be repeatedly achieved. ©1997 American Institute of Physics.
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