Electron microscopy and diffraction of thermally decomposed β‐silicon carbide whiskers
作者:
J. J. Comer,
期刊:
Journal of Applied Crystallography
(WILEY Available online 1971)
卷期:
Volume 4,
issue 1
页码: 12-15
ISSN:1600-5767
年代: 1971
DOI:10.1107/S0021889871006162
出版商: International Union of Crystallography
数据来源: WILEY
摘要:
Decomposition of β‐silicon carbide whiskers by heating in vacuum results in the formation of highly oriented graphite crystallites with basal planes tangent to the whisker surface but showing no structural relationship to the parent β‐silicon carbide. Doubling of the 00.lreflections of graphite is explained by refraction of the electron beam from faces parallel to the basal planes in a direction normal to the whisker
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