首页   按字顺浏览 期刊浏览 卷期浏览 Electron microscopy and diffraction of thermally decomposed β‐silicon carbide whiskers
Electron microscopy and diffraction of thermally decomposed β‐silicon carbide whiskers

 

作者: J. J. Comer,  

 

期刊: Journal of Applied Crystallography  (WILEY Available online 1971)
卷期: Volume 4, issue 1  

页码: 12-15

 

ISSN:1600-5767

 

年代: 1971

 

DOI:10.1107/S0021889871006162

 

出版商: International Union of Crystallography

 

数据来源: WILEY

 

摘要:

Decomposition of β‐silicon carbide whiskers by heating in vacuum results in the formation of highly oriented graphite crystallites with basal planes tangent to the whisker surface but showing no structural relationship to the parent β‐silicon carbide. Doubling of the 00.lreflections of graphite is explained by refraction of the electron beam from faces parallel to the basal planes in a direction normal to the whisker

 

点击下载:  PDF (1387KB)



返 回