Growth of InGaAs structures usinginsituelectrochemically generated arsine
作者:
D. N. Buckley,
C. W. Seabury,
J. L. Valdes,
G. Cadet,
J. W. Mitchell,
M. A. DiGiuseppe,
R. C. Smith,
J. R. C. Filipe,
R. B. Bylsma,
U. K. Chakrabarti,
K‐W. Wang,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 57,
issue 16
页码: 1684-1686
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.104136
出版商: AIP
数据来源: AIP
摘要:
The use, transportation, and storage of the hazardous gas, arsine, raise serious safety issues. Consequently, there is considerable interest in the generation of arsine on demand from less hazardous substances. We report the first use ofinsitugenerated arsine for III‐V epitaxy. The gas has been generated electrochemically at an arsenic cathode in an aqueous electrolyte and used to supply a hydride vapor phase epitaxy reactor. InGaAs/InP test structures were grown on InP substrates and were similar to comparison structures grown using tank arsine. Recessed‐gate enhanced Schottky metal‐semiconductor field‐effect transistors were fabricated and exhibited well‐behaved current‐voltage characteristics.
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