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Growth of InGaAs structures usinginsituelectrochemically generated arsine

 

作者: D. N. Buckley,   C. W. Seabury,   J. L. Valdes,   G. Cadet,   J. W. Mitchell,   M. A. DiGiuseppe,   R. C. Smith,   J. R. C. Filipe,   R. B. Bylsma,   U. K. Chakrabarti,   K‐W. Wang,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 57, issue 16  

页码: 1684-1686

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.104136

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The use, transportation, and storage of the hazardous gas, arsine, raise serious safety issues. Consequently, there is considerable interest in the generation of arsine on demand from less hazardous substances. We report the first use ofinsitugenerated arsine for III‐V epitaxy. The gas has been generated electrochemically at an arsenic cathode in an aqueous electrolyte and used to supply a hydride vapor phase epitaxy reactor. InGaAs/InP test structures were grown on InP substrates and were similar to comparison structures grown using tank arsine. Recessed‐gate enhanced Schottky metal‐semiconductor field‐effect transistors were fabricated and exhibited well‐behaved current‐voltage characteristics.

 

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