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Interference of three electron waves by two biprisms and its application to direct visualization of electromagnetic fields in small regions

 

作者: Tsukasa Hirayama,   Guanming Lai,   Takayoshi Tanji,   Nobuo Tanaka,   Akira Tonomura,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 82, issue 2  

页码: 522-527

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.365610

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We present a method for the interference of three electron waves and its application to direct visualization of pure phase objects such as electromagnetic microfields. Using a transmission electron microscope equipped with a field-emission electron gun and two electron biprisms, an object wave and two reference waves at either side of the object wave are superposed to produce a new type of interference pattern. In this pattern, equal-phase lines of the object wave are directly displayed as intensity modulation of periodic interference fringes. An electric field around a latex particle, induced by electron-beam irradiation, has been observed. The electric charge of the particle is estimated, from observed phase shift, to be6.4×10−17 C,which is equal to about 400 electrons. A change of the electric field around charged alumina particles at high temperatures has been observed dynamically. Magnetic flux lines emerging from a barium ferrite particle are also visualized. ©1997 American Institute of Physics.

 

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