Interference of three electron waves by two biprisms and its application to direct visualization of electromagnetic fields in small regions
作者:
Tsukasa Hirayama,
Guanming Lai,
Takayoshi Tanji,
Nobuo Tanaka,
Akira Tonomura,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 2
页码: 522-527
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365610
出版商: AIP
数据来源: AIP
摘要:
We present a method for the interference of three electron waves and its application to direct visualization of pure phase objects such as electromagnetic microfields. Using a transmission electron microscope equipped with a field-emission electron gun and two electron biprisms, an object wave and two reference waves at either side of the object wave are superposed to produce a new type of interference pattern. In this pattern, equal-phase lines of the object wave are directly displayed as intensity modulation of periodic interference fringes. An electric field around a latex particle, induced by electron-beam irradiation, has been observed. The electric charge of the particle is estimated, from observed phase shift, to be6.4×10−17 C,which is equal to about 400 electrons. A change of the electric field around charged alumina particles at high temperatures has been observed dynamically. Magnetic flux lines emerging from a barium ferrite particle are also visualized. ©1997 American Institute of Physics.
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