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Degradation mechanisms of Ga1−xAlxAs visible diode lasers

 

作者: T. Kajimura,  

 

期刊: Journal of Applied Physics  (AIP Available online 1980)
卷期: Volume 51, issue 2  

页码: 908-913

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.327666

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Degradation of Ga1−xAlxAs visible diode lasers in the 0.7‐&mgr;m wavelength region is investigated through room‐temperature life tests. A marked dependence of laser life on lasing wavelength is observed. In particular, degradation proceeds faster for shorter‐wavelength lasers. It is shown that the degradation of lasers radiating at wavelengths below 730 nm can mainly be attributed to the rapid formation of dark regions and dark‐line defects during aging. A notable improvement in life is obtained for these shorter‐wavelength lasers by Te doping of the active layer. On the other hand, degradation at above 740 nm results from enhanced facet oxidation due to high AlAs mole fractions in the active and cladding layers. This facet oxidation is effectively suppressed by facet coatings with SiO2films. As a result, stable operations, exceeding 4000 h, are achieved in the 740–770‐nm wavelength region.

 

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