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Attractive mode force microscopy using a feedback‐controlled fiber interferometer

 

作者: M. Nonnenmacher,   M. Vaez‐Iravani,   H. K. Wickramasinghe,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1992)
卷期: Volume 63, issue 11  

页码: 5373-5376

 

ISSN:0034-6748

 

年代: 1992

 

DOI:10.1063/1.1143405

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We present a force microscope which uses a feedback‐controlled differential fiber interferometer for the measurement of the deflection of the force‐sensing cantilever. Due to the differential principle, and the feedback control, the influence of thermal and mechanical drifts or fluctuations is minimized. Topographic images in both modes, the attractive ac mode and the repulsive dc mode, have been taken to demonstrate a first performance of the instrument.

 

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