Attractive mode force microscopy using a feedback‐controlled fiber interferometer
作者:
M. Nonnenmacher,
M. Vaez‐Iravani,
H. K. Wickramasinghe,
期刊:
Review of Scientific Instruments
(AIP Available online 1992)
卷期:
Volume 63,
issue 11
页码: 5373-5376
ISSN:0034-6748
年代: 1992
DOI:10.1063/1.1143405
出版商: AIP
数据来源: AIP
摘要:
We present a force microscope which uses a feedback‐controlled differential fiber interferometer for the measurement of the deflection of the force‐sensing cantilever. Due to the differential principle, and the feedback control, the influence of thermal and mechanical drifts or fluctuations is minimized. Topographic images in both modes, the attractive ac mode and the repulsive dc mode, have been taken to demonstrate a first performance of the instrument.
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