Thermal‐wave imaging of epoxy/aluminum interfaces
作者:
Kwangsoo No,
John F. McClelland,
期刊:
Journal of Applied Physics
(AIP Available online 1988)
卷期:
Volume 64,
issue 4
页码: 1730-1735
ISSN:0021-8979
年代: 1988
DOI:10.1063/1.341768
出版商: AIP
数据来源: AIP
摘要:
Laser‐excited thermal‐wave image magnitude and phase were acquired by photoacoustic detection in the 10–1000‐Hz modulation frequency range on epoxy/aluminum interface systems with surface (black) and bulk (white) laser‐absorbing epoxy, different planar interface distances, surface and subsurface flaws, and different surface angle boundaries. The following conclusions were reached from the thermal‐wave results: (1) thermally thin epoxy on aluminum layer thicknesses can be estimated from variable modulation frequency data; (2) planar and subsurface defect interface structures of epoxy/aluminum systems are best studied by examining both magnitude and phase images; (3) thermal‐wave images are more straightforward to interpret for the systems that absorb light at the irradiated surface rather than in the bulk. These conclusions are consistent with thermal diffusion length and thermal‐wave reflection effects predicted by theory for surface light‐absorption conditions.
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