Charge state yield data for the production of Ar ion beams from a Penning ion source have been previously analyzed by Fuchs. These data have been reanalyzed in calculations which take into account the Auger process at any level of ionization, electron recombination, and charge state dependent and independent losses. For a wide range of simple two‐energy electron distributions, and for a discrete approximation to a distribution of thermalized electrons plus a Gaussian distribution of primary electrons, fits can be obtained which are as much as two orders of magnitude better for Ar9+and even more improved for 10+. The fitting parameters all lie near &agr; [inverted lazy s] 10−8for the recombination rate coefficient and &tgr; [inverted lazy s] 1 &mgr;sec for ion lifetime for an electron density of 3×1014/cm3The contribution to the rate of change of charge state populationqidue to electron recombination is assumed to be (&rgr;eqii2&agr;), where &rgr;eis the electron density. The Auger effect is included as a 2‐electron process for most of the calculations. The estimated cross sections for Auger effects are derived similarly to those used in a feasibility study of electron beam sources of very heavy, highly ionized beams.