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The temperature dependence of degradation mechanisms in long‐lived (GaAl)As DH lasers

 

作者: S. Ritchie,   R. F. Godfrey,   B. Wakefield,   D. H. Newman,  

 

期刊: Journal of Applied Physics  (AIP Available online 1978)
卷期: Volume 49, issue 6  

页码: 3127-3132

 

ISSN:0021-8979

 

年代: 1978

 

DOI:10.1063/1.325305

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An investigation into the effects of temperature on degradation mechanisms in GaAs/GaAlAs DH lasers has been carried out. A mechanism (or mechanisms) independent of stimulated light levels is found to be relatively insensitive to temperature. This suggests that a residual failure mechanism may be associated with defect motion being enhanced by nonradiative recombination. A statistical analysis of the lifetest results and photoluminescence studies of lifetested devices suggest that there may be different mechanisms in operation at different temperatures. Thus, great care must be exercised before using conventional extrapolation techniques to predict laser lives at room temperature.

 

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