UHV sample mount for the temperature range 10–1300 K
作者:
R. E. Palmer,
P. V. Head,
R. F. Willis,
期刊:
Review of Scientific Instruments
(AIP Available online 1987)
卷期:
Volume 58,
issue 6
页码: 1118-1120
ISSN:0034-6748
年代: 1987
DOI:10.1063/1.1139621
出版商: AIP
数据来源: AIP
摘要:
We describe a sample mounting facility capable of cooling a graphite crystal to temperatures of around 10 K (to enable investigation of low‐temperature physisorbed phases) and which at the same time permits the crystal to be heated to 1300 K for surface cleaning. A demountable resistive heating mechanism avoids the conductive loading of the sample which normally inhibits the attainment of very low temperatures.
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