Coulomb blockade oscillations at room temperature in a Si quantum wire metal‐oxide‐semiconductor field‐effect transistor fabricated by anisotropic etching on a silicon‐on‐insulator substrate
作者:
H. Ishikuro,
T. Fujii,
T. Saraya,
G. Hashiguchi,
T. Hiramoto,
T. Ikoma,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 68,
issue 25
页码: 3585-3587
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.116645
出版商: AIP
数据来源: AIP
摘要:
We have developed a very controllable fabrication process of an extremely narrow (∼10 nm) quantum wire metal‐oxide‐semiconductor field‐effect transistor (MOSFET) on a separation‐by‐implanted‐oxygen (SIMOX) substrate using anisotropic etching and selective oxidation technique. The drain current versus gate voltage characteristics show oscillations caused by Coulomb blockade even at room temperature. The oscillations split into several sharp peaks when the temperature is decreased, indicating that the channel is separated by several serial coupled quantum dots and that the quantum levels of these dots correspond to the observed fine peaks. ©1996 American Institute of Physics.
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