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Tip–sample interaction forces in scanning tunneling microscopy: Effects of contaminants

 

作者: S. C. Meepagala,   F. Real,   C. B. Reyes,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  （AIP Available online 1991）
卷期: Volume 9, issue 2  

页码: 1340-1342

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585192

 

出版商: American Vacuum Society

 

关键词: SCANNING TUNNELING MICROSCOPY;ATOMIC FORCE MICROSCOPY;SURFACE CONTAMINATION;GOLD;CURRENT DENSITY;INTERACTIONS;AIR;SURFACE FORCES

 

数据来源: AIP

 

摘要:

We have made simultaneous measurements of the tunnel current and the force of interaction as a gold‐coated cantilever approaches towards and recedes from a gold sample in atmosphere. We will describe the effects arising from the surface contaminant layer. We also have made an estimation of the minimum value of the contact (repulsive) force that should be present for tunneling between gold and gold in air to be observed.

 

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