High-temperature persistent spectral hole burning ofEu3+-dopedSiO2glass prepared by the sol-gel process
作者:
Masayuki Nogami,
Yoshihiro Abe,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 24
页码: 3465-3467
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120361
出版商: AIP
数据来源: AIP
摘要:
Persistent spectral hole burning was observed at temperatures higher than 77 K inSiO2glass doped with theEu3+ions. TheEu3+-dopedSiO2glass was prepared using the sol-gel process ofSi(OC2H5)4andEuCl3⋅6H2O.A persistent spectral hole was burned in the excitation spectrum of the7F0→5D0transition ofEu3+using a Rhodamine 6G dye laser, of which the hole width and depth were1.6 cm−1and∼20&percent;of the total intensity, respectively, at 77 K. Hole depth decreased with increasing temperature and disappeared above∼130 K.A possible mechanism for the hole burning is related to the local structure aroundEu3+and the residual OH andH2Oin the glass. ©1997 American Institute of Physics.
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