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High-temperature persistent spectral hole burning ofEu3+-dopedSiO2glass prepared by the sol-gel process

 

作者: Masayuki Nogami,   Yoshihiro Abe,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 24  

页码: 3465-3467

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.120361

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Persistent spectral hole burning was observed at temperatures higher than 77 K inSiO2glass doped with theEu3+ions. TheEu3+-dopedSiO2glass was prepared using the sol-gel process ofSi(OC2H5)4andEuCl3⋅6H2O.A persistent spectral hole was burned in the excitation spectrum of the7F0→5D0transition ofEu3+using a Rhodamine 6G dye laser, of which the hole width and depth were1.6 cm−1and∼20&percent;of the total intensity, respectively, at 77 K. Hole depth decreased with increasing temperature and disappeared above∼130 K.A possible mechanism for the hole burning is related to the local structure aroundEu3+and the residual OH andH2Oin the glass. ©1997 American Institute of Physics.

 

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