Improved Probe Apparatus for Measuring Contact Resistance
作者:
Saul W. Chaikin,
Jack R. Anderson,
George J. Santos,
期刊:
Review of Scientific Instruments
(AIP Available online 1961)
卷期:
Volume 32,
issue 12
页码: 1294-1296
ISSN:0034-6748
年代: 1961
DOI:10.1063/1.1717236
出版商: AIP
数据来源: AIP
摘要:
An apparatus, employing a fine‐wire probe, for the detection of insulating surface films on metal surfaces is described. A chemical cleaning procedure to prepare reliably clean palladium and gold surfaces is reported, and examples of the reproducibility of the method are given. Examples of the use of this apparatus include: the detection of high resistance areas on relay contacts taken from sealed relays, and a study of insulating base metal oxide impurities in commercial relay contacts. In the latter work, a sensitized paper test showed areas of iron and copper deposits on the contacts which could be correlated with areas of high resistance as indicated by the probe.
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