首页   按字顺浏览 期刊浏览 卷期浏览 Can atomic force microscopy tips be inspected by atomic force microscopy?
Can atomic force microscopy tips be inspected by atomic force microscopy?

 

作者: Louis Hellemans,   Koen Waeyaert,   Frans Hennau,   Lieve Stockman,   Ilse Heyvaert,   Chris Van Haesendonck,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  （AIP Available online 1991）
卷期: Volume 9, issue 2  

页码: 1309-1312

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585185

 

出版商: American Vacuum Society

 

关键词: ATOMIC FORCE MICROSCOPY;DISTORTION;PROBES;DIAMONDS;SAMPLE HOLDERS;IMAGE FORMING;CONVOLUTION;TIPS

 

数据来源: AIP

 

摘要:

An attempt has been made to image prospective tips by atomic force microscopy. The apex of mounted diamond fragments and of traditional metallic tips was investigated by the same diamond probe. The peculiar tip–tip configuration allowed to search for the effect of sample rotation on the images. Identical images were obtained when the diamond stylus scanned different etched tungsten tips, illustrating an interchange in the roles of tip and sample.

 

点击下载:  PDF (449KB)



返 回