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High‐brightness pseudospark‐produced electron beam

 

作者: E. Boggasch,   M. J. Rhee,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 56, issue 18  

页码: 1746-1748

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.103087

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The first time‐integrated root mean square (rms) emittance measurement of a pseudospark‐produced electron beam is presented. From a six‐gap pseudospark chamber with argon working gas, ∼10 Hz repetitive pulsed electron beams of average energy ∼20 keV, peak current ∼50 A, and pulse duration ∼10 ns are extracted into a drift tube. A typical value of measured rms emittance is found to be &egr;≊55 mm mrad, yielding a normalized rms emittance of &egr;n≊15 mm mrad. The normalized brightness of the beam is then estimated to beBn≊4×1010A/(m2 rad2).

 

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