High‐brightness pseudospark‐produced electron beam
作者:
E. Boggasch,
M. J. Rhee,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 18
页码: 1746-1748
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.103087
出版商: AIP
数据来源: AIP
摘要:
The first time‐integrated root mean square (rms) emittance measurement of a pseudospark‐produced electron beam is presented. From a six‐gap pseudospark chamber with argon working gas, ∼10 Hz repetitive pulsed electron beams of average energy ∼20 keV, peak current ∼50 A, and pulse duration ∼10 ns are extracted into a drift tube. A typical value of measured rms emittance is found to be &egr;≊55 mm mrad, yielding a normalized rms emittance of &egr;n≊15 mm mrad. The normalized brightness of the beam is then estimated to beBn≊4×1010A/(m2 rad2).
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