The study of the thermal oxide films on silicon wafers by Fourier transform infrared attenuated total reflection spectroscopy
作者:
Yoshikatsu Nagasawa,
Ichirou Yoshii,
Kiyomi Naruke,
Kazuhiko Yamamoto,
Hideyuki Ishida,
Akira Ishitani,
期刊:
Journal of Applied Physics
(AIP Available online 1990)
卷期:
Volume 68,
issue 4
页码: 1429-1434
ISSN:0021-8979
年代: 1990
DOI:10.1063/1.346669
出版商: AIP
数据来源: AIP
摘要:
Fourier transform infrared attenuated total reflectance technique was used to measure the SiOH and SiH contents in the thermal oxide films grown on Si wafers. It was found that the SiOH groups in the bulk could be eliminated by annealing at 850 °C, whereas SiOH at the Si/SiO2interface could only be removed by annealing at 1000 °C. It was also found that SiOH and SiH groups were generated in the thin oxide film by &ggr;‐ray irradiation. The presence of H or H2in SiO2is necessary to explain the result.
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